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Keywords | |
Abstract |
We outline a method to determine the intensity of the second harmonic emitted from a semiconductor surface. Calculations have been carried out for Si(111)/As and compared with second-harmonic generation experiments carried out on the same surface. |
Year of Publication |
1993
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Journal |
Surface Science
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Volume |
287-288
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Number of Pages |
693-698
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ISSN Number |
0039-6028
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URL |
http://www.sciencedirect.com/science/article/B6TVX-4D045KF-54/2/a1fee3294f868ebafbf2cf64b27dd6e2
|
DOI |
DOI: 10.1016/0039-6028(93)91055-T
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