| Author | |
|---|---|
| Keywords | |
| Abstract |
We outline a method to determine the intensity of the second harmonic emitted from a semiconductor surface. Calculations have been carried out for Si(111)/As and compared with second-harmonic generation experiments carried out on the same surface. |
| Year of Publication |
1993
|
| Journal |
Surface Science
|
| Volume |
287-288
|
| Number of Pages |
693-698
|
| ISSN Number |
0039-6028
|
| URL |
http://www.sciencedirect.com/science/article/B6TVX-4D045KF-54/2/a1fee3294f868ebafbf2cf64b27dd6e2
|
| DOI |
DOI: 10.1016/0039-6028(93)91055-T
|
| Download citation |